$ sudo smartctl -a /dev/sdb
smartctl 5.41 2011-06-09 r3365 [i686-linux-2.6.38.5-zen] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Deskstar 7K1000.C
Device Model: Hitachi HDS721010CLA332
Serial Number: JP2930HQ0XUY8H
LU WWN Device Id: 5 000cca 35dcd1bc8
Firmware Version: JP4OA39C
User Capacity: 1 000 204 886 016 bytes [1,00 TB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Sat Sep 24 10:55:41 2011 MSK
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 9988) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 167) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 095 095 016 Pre-fail Always - 589828
2 Throughput_Performance 0x0005 135 135 054 Pre-fail Offline - 96
3 Spin_Up_Time 0x0007 226 226 024 Pre-fail Always - 190 (Average 145)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 459
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 7
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 130 130 020 Pre-fail Offline - 35
9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 13228
10 Spin_Retry_Count 0x0013 001 001 060 Pre-fail Always FAILING_NOW 1638424
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 139
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 316
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 318
194 Temperature_Celsius 0x0002 142 142 000 Old_age Always - 42 (Min/Max 25/58)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 8
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 3
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 3526 hours (146 days + 22 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 08 4f d2 59 00 Error: ICRC, ABRT at LBA = 0x0059d24f = 5886543
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 78 08 df d1 59 40 00 1d+23:04:29.454 READ FPDMA QUEUED
60 08 00 d7 d1 59 40 00 1d+23:04:29.454 READ FPDMA QUEUED
60 30 00 f7 8c 60 40 00 1d+23:04:29.428 READ FPDMA QUEUED
60 20 00 d7 8c 60 40 00 1d+23:04:29.364 READ FPDMA QUEUED
60 78 08 df ce 59 40 00 1d+23:04:29.338 READ FPDMA QUEUED
Error 2 occurred at disk power-on lifetime: 11 hours (0 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 20 37 48 2a 00 Error: ICRC, ABRT at LBA = 0x002a4837 = 2770999
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 80 00 d7 47 2a 40 00 2d+20:50:25.709 WRITE FPDMA QUEUED
61 80 00 57 47 2a 40 00 2d+20:50:25.704 WRITE FPDMA QUEUED
61 80 00 d7 46 2a 40 00 2d+20:50:25.693 WRITE FPDMA QUEUED
61 80 00 57 46 2a 40 00 2d+20:50:25.688 WRITE FPDMA QUEUED
61 80 00 d7 45 2a 40 00 2d+20:50:25.684 WRITE FPDMA QUEUED
Error 1 occurred at disk power-on lifetime: 11 hours (0 days + 11 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 60 77 82 d2 00 Error: ICRC, ABRT at LBA = 0x00d28277 = 13795959
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 80 00 57 82 d2 40 00 2d+20:10:45.500 WRITE FPDMA QUEUED
61 80 00 d7 81 d2 40 00 2d+20:10:45.495 WRITE FPDMA QUEUED
61 80 00 57 81 d2 40 00 2d+20:10:45.490 WRITE FPDMA QUEUED
61 80 00 d7 80 d2 40 00 2d+20:10:45.485 WRITE FPDMA QUEUED
61 80 00 57 80 d2 40 00 2d+20:10:45.481 WRITE FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.